Ebook Thin Film Materials: Stress, Defect Formation and Surface Evolution, by L. B. Freund, S. Suresh
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Thin Film Materials: Stress, Defect Formation and Surface Evolution, by L. B. Freund, S. Suresh
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This book provides comprehensive coverage of stress, defect formation and surface evolution in thin films. With its balanced coverage of theory, experiment and simulation and many homework problems, the text will be essential reading in senior undergraduate and graduate courses on thin films.
- Sales Rank: #3327579 in Books
- Published on: 2004-02-02
- Original language: English
- Number of items: 1
- Dimensions: 9.72" h x 1.61" w x 6.85" l, 3.60 pounds
- Binding: Hardcover
- 770 pages
Review
'The book is a landmark in a rich subject which has seen many developments over the past decade. In addition to being beautifully written, the book contains many illustrations, micrographs, and problems for students. The book will serve as a graduate text, as well as a comprehensive monograph everyone working in the field will want to own.' Professor John W. Hutchinson, Harvard University
'Freund and Suresh have written a masterpiece on thin film materials that will become a classic reference for this newly developed field. Their book provides an organized and beautifully written exposition of the subject of thin film mechanical behavior. For the first time there is a single starting point for the field. The book brings together materials and mechanics aspects of thin films effortlessly, reflecting the authors' expertise in joining these fields of science and engineering.' Professor William D. Nix, Stanford University
'I would heartily recommend this book as an essential read for anyone working in any area of thin film deposition.' Materials World
'Thin Film Materials will prove a valuable resource. It contains a wealth of useful references and good indexes. It is richly illustrated, and there are good exercises after each chapter. For a graduate course in the field, it will be hard to beat. And if the authors are right, there will be a growing demand for such courses.' The Times Higher Education Supplement
About the Author
L. Ben Freund is the Henry Ledyard Goddard University Professor in the Division of Engineering at Brown University.
Subra Suresh is the Ford Professor of Engineering and Head of the Department of Materials Science and Engineering, and Professor of Mechanical Engineering at Massachusetts Institute of Technology.
Most helpful customer reviews
0 of 0 people found the following review helpful.
Essential reference book for Materials Scientists and Process Engineers working with thin films.
By Russell Blume
Absolutely essential book for understanding fracture and delamination in thin films.
5 of 5 people found the following review helpful.
A good book indeed; highly recommend it.
By Entropy4Life
I like this book for it is a rather comprehensive treatment of the subject, and is written in a clear prose. However, one should realize that the focus is solely on the mechanical behavior of thin films, which could be attributed to the authors background and research interests.
Virtually, all properties of thin films (electronic, magnetic, optical, ferroelecrtic, multiferroic etc.) are affected if not chiefly governed by the elastic coupling of "order" parameters with strains and such, especially at nanoscopic length scales. This book is primarily devoted to mechanical behavior of thin films in an isolated fashion. For instance, misfit dislocation and critical thickness phenomena in thin films is treated with linear elasticity models, so much so that it is of limited use in thin films of multifunctional materials (ferromagnetics, ferroelectics, ferroelastics, multiferroics etc). However, the book by Freund and Suresh is an excellent introductory text from a mechanical behavior perspective. It develops all core concepts efficiently and thoroughly. And as such, it is of fundamental importance. I highly recommend it.
Entropy4Life
8 of 9 people found the following review helpful.
highly recommend it
By N. Singh
Okay we followed this book for our lecture in thin films given by the first author of the book LB Freund, one of the best instructors i ever had. i will try not to be biased by his teaching skills while writing this review. i would say that its a must reference who are working in thin film area be it experimental or modeling. but i believe that you need to have a sound background atleast in continuum mechanics and elasticity to fully follow the mechanics (of deformation) part of the thin film on your own. the best thing i liked about this book is its methodical structure for e.g. deriving the basic Stoney's relation by minimizing the energy, then talk about its assumption in detail and then removing those assumptions one by one to make the relation more realistic (and offcourse more complicated). there are other things like material properties of common thin film materials used in microelectronics, topics on surface morphology etc. his writing style is very clear... again not for someone who doesnt have necessary background.
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